## Abstract An improved padโdeembedding technique for InGaP/GaAs HBT reducing uncertainty in measurement and equivalent circuit is proposed. Intrinsic elements are obtained by iteratively determining the external and internal base resistance. The extracted equivalent circuits demonstrate good agree
A novel direct parameter-extraction method for GaInP/GaAs HBTs small-signal model
โ Scribed by Haiwen Liu; Xiaowei Sun; Zhengfan Li; Junfa Mao
- Publisher
- John Wiley and Sons
- Year
- 2004
- Tongue
- English
- Weight
- 122 KB
- Volume
- 14
- Category
- Article
- ISSN
- 1096-4290
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โฆ Synopsis
An accurate and broadband method for heterojunction bipolar transistors (HBTs) small-signal model parameters is presented in this article. This method differs from previous ones by extracting the equivalent-circuit parameters without using a special test structure or global numerical optimization techniques. The main advantage of this method is that a unique and physically meaningful set of intrinsic parameters is extracted from impedance and admittance representation of the measured S-parameters in the frequency range of 1-12 GHz under extracted-bias conditions. An equivalent circuit for the HBT under a forward-bias condition is proposed for extraction of access resistance and parasitic inductance. The method yields a deviation of less then 5% between the measured and modeled S-parameters.
๐ SIMILAR VOLUMES
An extraction technique to determine the small-signal HBT equiยจalent circuit is presented. Some of the extrinsic element ยจalues are extracted by using an analytical approach, while the remaining ones are calculated adopting a statistical method. All of the model elements are uniquely determined. Sat
## Abstract A simple and efficient method to extract model parameters of a smallโsignal MOSFET equivalent circuit, including substrate resistance and capacitance, is proposed. Unlike previous methods, substrate parameters, resistances, and inductances are directly determined without any curveโfitti
## Abstract ยฉ 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 43: 268, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20440
## Abstract ยฉ 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 43: 269, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20441