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Prevention of impurity gettering in the RP/2 region of ion-implanted silicon by defect engineering

✍ Scribed by R. Kögler; A. Peeva; J. Kaschny; W. Skorupa; H. Hutter


Book ID
114165198
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
120 KB
Volume
186
Category
Article
ISSN
0168-583X

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