✦ LIBER ✦
Evidence for interstitial-type defects in the Rp/2 region of MeV-self-ion-implanted silicon produced by standard ion milling procedure
✍ Scribed by A Peeva; R Kögler; P Werner; A.A.D de Mattos; P.F.P Fichtner; M Behar; W Skorupa
- Book ID
- 114172013
- Publisher
- Elsevier Science
- Year
- 2000
- Tongue
- English
- Weight
- 165 KB
- Volume
- 161-163
- Category
- Article
- ISSN
- 0168-583X
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