𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Preparation of metal multilayer TEM cross-sections using ultramicrotomy

✍ Scribed by D. A. HOWELL; J. W. HECKMAN JR; M. A. CRIMP

Book ID
119836437
Publisher
John Wiley and Sons
Year
1995
Tongue
English
Weight
914 KB
Volume
180
Category
Article
ISSN
0022-2720

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Ultramicrotomy of diamond films for tem
Ultramicrotomy of diamond films for tem cross-section analysis
✍ P. Swab πŸ“‚ Article πŸ“… 1995 πŸ› John Wiley and Sons 🌐 English βš– 281 KB

## Abstract Ultramicrotomy has been used to prepare TEM cross‐sections of typical hard dielectric, semiconductor, and metal coatings, providing a critical capability in the study of structure‐property relationships of thin films. Ultramicrotomy of thin film coatings requires meticulous attention to

Cross-section TEM sample preparation of
Cross-section TEM sample preparation of multilayer and poorly adhering films
✍ Weaver, Louise πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 232 KB πŸ‘ 2 views

The preparation of TEM cross-section samples from multilayer films or poorly adhering films is discussed in detail in a step-by-step approach designed to enable a competent experimentalist to reproduce the technique. The samples are mounted on an aperture grid and mechanically polished to 2-3 micron

Preparation of multilayered materials in
Preparation of multilayered materials in cross-section for in situ TEM tensile deformation studies
✍ Wall, Mark A.; Barbee, Jr., Troy W.; Weihs, Timothy P. πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 366 KB πŸ‘ 2 views

The success of in situ transmission electron microscopy experimentation is often dictated by proper specimen preparation and sample design procedures. We have developed a novel technique permitting the production of tensile specimens of multilayered films in cross-section for in situ deformation stu