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Preparation of metallized GaN/sapphire cross sections for TEM analysis using wedge polishing

✍ Scribed by J. Chen; D.G. Ivey

Book ID: 108480879
Publisher: Elsevier Science
Year: 2002
Tongue: English
Weight: 135 KB
Volume: 33
Category: Article
ISSN: 0968-4328
DOI: 10.1016/s0968-4328(01)00038-5

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