✦ LIBER ✦

A simple, quick and reliable method for TEM cross-section preparation of ceramic oxide films on thin metal substrates

✍ Scribed by D. Eyidi; O. Eibl

Publisher: Elsevier Science
Year: 2002
Tongue: English
Weight: 435 KB
Volume: 33
Category: Article
ISSN: 0968-4328
DOI: 10.1016/s0968-4328(02)00018-5

No coin nor oath required. For personal study only.

✦ Synopsis

We present a preparation method of cross-sectional thin foils for transmission electron microscopy (TEM). Samples are 0.1±1 mm thick ceramic oxide ®lms (CeO 2 , CeO 2 ±YBa 2 Cu 3 O 7 and CeO 2 ±ZrO 2 /YO 2 ±YBa 2 Cu 3 O 7 ) epitaxially grown on 30±100 mm highly textured nickel substrates. This method includes gluing the sample between a copper oxide dummy and a silicon dummy, followed by mechanical polishing and conventional ion milling. TEM cross-sectional samples obtained with this selection of dummies are electron-transparent up to a few tens of mm parallel to the ®lm surface. Several layer structures were analyzed by TEM and the results are shown. The preparation technique described here can be applied to any type of oxide ®lm deposited on thin metal substrates.

📜 SIMILAR VOLUMES

A novel method for the cross-sectional T

A novel method for the cross-sectional TEM preparation of thin films deposited onto water-soluble substrates

✍ György Sáfrán; Pierre Panine 📂 Article 📅 1993 🏛 John Wiley and Sons 🌐 English ⚖ 499 KB 👁 1 views

A preparational method was developed solving the problem of cross-sectional TEM preparation of thin films and layer systems deposited onto water-soluble substrates. The technique is based on the replacement of the sample onto steady substrate, followed by mechanical and ion beam thinning. Cross-sect