## Abstract A method is described for the preparation of cross‐sectional samples of thin films for transmission electron microscopy. The technique produces larger amounts of thin region as compared with ion milling and eliminates the problems associated with ion beam damage. The requirement is that
✦ LIBER ✦
A novel method for the cross-sectional TEM preparation of thin films deposited onto water-soluble substrates
✍ Scribed by György Sáfrán; Pierre Panine
- Publisher
- John Wiley and Sons
- Year
- 1993
- Tongue
- English
- Weight
- 499 KB
- Volume
- 25
- Category
- Article
- ISSN
- 1059-910X
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✦ Synopsis
A preparational method was developed solving the problem of cross-sectional TEM preparation of thin films and layer systems deposited onto water-soluble substrates. The technique is based on the replacement of the sample onto steady substrate, followed by mechanical and ion beam thinning. Cross-sectional TEM micrographs of Ag and AglAg,Se layers are shown presenting the efficiency of this novel technique.
📜 SIMILAR VOLUMES
A novel technique for the preparation of
✍
Heuer, J. P. ;Howitt, D. G.
📂
Article
📅
1990
🏛
Wiley (John Wiley & Sons)
🌐
English
⚖ 256 KB
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