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Phtovoltage Spectroscopy of Fast Surface States in Silicon MOS Structures

✍ Scribed by Seilenthal, M. ;Rebane, K.-S.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Photoemission of Electrons from Interfac

✍ Fertig, W. ;Pagnia, H. 📂 Article 📅 1986 🏛 John Wiley and Sons 🌐 English ⚖ 332 KB

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✍ O. Csabay; H. Frank 📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 376 KB

Orientation dependence of surface states

✍ A. M. Narsale; R. Pratap; B. M. Arora 📂 Article 📅 1989 🏛 Springer 🌐 English ⚖ 197 KB

Saturation capacitance of thin oxide MOS

✍ J. Maserjian; G. Petersson; C. Svensson 📂 Article 📅 1974 🏛 Elsevier Science 🌐 English ⚖ 355 KB

Photoelectrical method of determination

✍ Krawczyk, S. ;Jakubowski, A. 📂 Article 📅 1980 🏛 John Wiley and Sons 🌐 English ⚖ 100 KB

Study of SiO2/Si interface states in MOS

✍ A. Ermolieff; S. Deleonibus; S. Marthon; B. Blanchard; J. Piaguet 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 610 KB