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Photoelectrical method of determination of fast surface states density in MIS structures

✍ Scribed by Krawczyk, S. ;Jakubowski, A.


Publisher
John Wiley and Sons
Year
1980
Tongue
English
Weight
100 KB
Volume
58
Category
Article
ISSN
0031-8965

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Simple method for accurate determination
✍ A Koukab; A Bath; O Baehr πŸ“‚ Article πŸ“… 1999 πŸ› Elsevier Science 🌐 English βš– 117 KB

A simple method for the determination of the mean interface density D of MIS structures is proposed. The method is itm based on modified bias-thermal stress measurements and combines capacitance-voltage measurements with doping profile determination. The method is illustrated on InP MIS structures w