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Influence of surface treatment of silicon on the effective impurity charge density in surface states of MOS structures

✍ Scribed by O. Csabay; H. Frank

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 376 KB
Volume: 16
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(73)90197-4

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