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Influence of surface treatment of silicon on the effective impurity charge density in surface states of MOS structures : O. Csabay and H. Frank. Solid State Electron.16 (1973) 985

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 107 KB
Volume: 12
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(73)90199-6

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📜 SIMILAR VOLUMES

Influence of surface treatment of silico

Influence of surface treatment of silicon on the effective impurity charge density in surface states of MOS structures

✍ O. Csabay; H. Frank 📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 376 KB

The influence of the silicon and oxide l

The influence of the silicon and oxide layer surface treatment on the effective defect charge density in a MOS structure : O. Csabay and H. Frank. Elektrotechnický časopis 24, (4) 228 (1973). (In Czechoslovakian)

📂 Article 📅 1974 🏛 Elsevier Science 🌐 English ⚖ 126 KB

Influence of interface charge inhomogene

Influence of interface charge inhomogeneities on the measurement of surface state densities in Si-SiO2 interfaces by means of the MOS a.c. conductance technique : Paul A. Muls, Gilbert J. Declerck and Roger J. van Overstraeten. Solid-St. Electron. 20, 911 (1977)

📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 251 KB