✦ LIBER ✦

Path testing in circuits with functional units

✍ Scribed by M. M. Garashchuk

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

4942577 Logic circuit system with latch

✍ Hidehar Ozaki 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 46 KB

The optimistic update theorem for path d

✍ Soumitra Bose; Prathima Agrawal; Vishwani D. Agrawal 📂 Article 📅 1993 🏛 Springer US 🌐 English ⚖ 501 KB

Identifying Untestable Faults in Sequent

✍ Taavi Viilukas, Anton Karputkin, Jaan Raik, Maksim Jenihhin, Raimund Ubar, Hideo 📂 Article 📅 2012 🏛 Springer US 🌐 English ⚖ 555 KB

Input Necessary Assignments for Testing

✍ Pomeranz, I.; Reddy, S.M. 📂 Article 📅 2011 🏛 IEEE 🌐 English ⚖ 245 KB

A simulator for at-speed robust testing

✍ Yuan-Chieh Hsu; Gupta, S.K. 📂 Article 📅 1996 🏛 IEEE 🌐 English ⚖ 937 KB

Combined in-circuit and functional tests

✍ Torky I. Sultan 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 107 KB