✦ LIBER ✦
Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints
✍ Scribed by Taavi Viilukas, Anton Karputkin, Jaan Raik, Maksim Jenihhin, Raimund Ubar, Hideo Fujiwara
- Book ID
- 118800841
- Publisher
- Springer US
- Year
- 2012
- Tongue
- English
- Weight
- 555 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0923-8174
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