4942577 Logic circuit system with latch circuits for reliable scan-path testing

✍ Scribed by Hidehar Ozaki

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 46 KB
• Volume: 31
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(91)90016-z