✦ LIBER ✦

Partitioning circuits for improved testability

✍ Scribed by Sandeep N. Bhatt; Fan R. K. Chung; Arnold L. Rosenberg

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

An improved register–transfer level func

✍ Tianruo Yang; Zebo Peng 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 256 KB

✍ Cheng, Benmao; Wang, Hong; Yang, Shiyuan; Niu, Daoheng; Jin, Yang 📂 Article 📅 2008 🏛 Bioline International 🌐 English ⚖ 348 KB

Design for testability of sequential cir

✍ Sun, X.; Lombardi, F. 📂 Article 📅 1994 🏛 The Institution of Electrical Engineers 🌐 English ⚖ 599 KB

A partition and resynthesis approach to

✍ Kanjilal, S.; Chakradhar, S.T.; Agrawal, V.D. 📂 Article 📅 1995 🏛 IEEE 🌐 English ⚖ 963 KB

CMOS layout generation for improved test

✍ Olaf Stern; H.T. Vierhaus 📂 Article 📅 1990 🏛 Elsevier Science ⚖ 703 KB

Design of modular digital circuits for t

✍ Kusiak, A.; Huang, C.-C. 📂 Article 📅 1997 🏛 IEEE ⚖ 224 KB