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A partition and resynthesis approach to testable design of large circuits

✍ Scribed by Kanjilal, S.; Chakradhar, S.T.; Agrawal, V.D.

Book ID: 119778004
Publisher: IEEE
Year: 1995
Tongue: English
Weight: 963 KB
Volume: 14
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.466342

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