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Design for testability of digital combinational circuits: A lisp approach

✍ Scribed by Fadi N. Sibai

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 466 KB
Volume: 4
Category: Article
ISSN: 0952-1976
DOI: 10.1016/0952-1976(91)90018-2

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