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Paramagnetic P[sub b]-type interface defects in thermal (110)Si/SiO[sub 2]

✍ Scribed by Keunen, K.; Stesmans, A.; Afanas’ev, V. V.

Book ID: 127370907
Publisher: American Institute of Physics
Year: 2011
Tongue: English
Weight: 321 KB
Volume: 98
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.3590271

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