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Electrical Evaluation of Defects at the Si(100)/HfO[sub 2] Interface

✍ Scribed by O’Sullivan, B. J.; Hurley, P. K.; O’Connor, E.; Modreanu, M.; Roussel, H.; Jimenez, C.; Dubourdieu, C.; Audier, M.; Sénateur, J. P.

No coin nor oath required. For personal study only.

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