✦ LIBER ✦

Identification of sub-band-gap absorption features at the HfO[sub 2]âSi(100) interface via spectroscopic ellipsometry

✍ Scribed by Price, J.; Lysaght, P. S.; Song, S. C.; Li, Hong-Jyh; Diebold, A. C.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Si dangling-bond-type defects at the int

✍ Stesmans, A.; Afanasâev, V. V. 📂 Article 📅 2003 🏛 American Institute of Physics 🌐 English ⚖ 360 KB

[IEEE Digest of Technical Papers. 2004 S

✍ Pantisano, L.; Chen, P.J.; Afanas'ev, V.; Ragnarsson, L.-A.; Pourtois, G.; Groes 📂 Article 📅 2004 🏛 IEEE ⚖ 201 KB

Identification of sub-band-gap absorption features at the HfO[sub 2]âSi(100) interface via spectroscopic ellipsometry