𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Honolulu, HI, USA (2004.06.17-2004.06.17)] Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Direct measurement of barrier height at the HfO/sub 2//poly-Si interface: Band structure and local effects

✍ Scribed by Pantisano, L.; Chen, P.J.; Afanas'ev, V.; Ragnarsson, L.-A.; Pourtois, G.; Groeseneken, G.

Book ID: 126768520
Publisher: IEEE
Year: 2004
Weight: 201 KB
Category: Article
ISBN-13: 9780780382893
DOI: 10.1109/VLSIT.2004.1345429

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Digest of Technical Papers. 2004 S

[IEEE Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Honolulu, HI, USA (2004.06.17-2004.06.17)] Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Device challenges and opportunities

✍ Chenming Hu, 📂 Article 📅 2004 🏛 IEEE ⚖ 160 KB

[IEEE Digest of Technical Papers. 2004 S

[IEEE Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Honolulu, HI, USA (2004.06.17-2004.06.17)] Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - 5nm-gate nanowire FinFET

✍ Fu-Liang Yang, ; Di-Hong Lee, ; Hou-Yu Chen, ; Chang-Yun Chang, ; Sheng-Da Liu, 📂 Article 📅 2004 🏛 IEEE ⚖ 194 KB

[IEEE Digest of Technical Papers. 2004 S

[IEEE Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Honolulu, HI, USA (2004.06.17-2004.06.17)] Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Direct measurement of stress dependent inversion layer mobility using a novel test structure

✍ Okagaki, T.; Tanizawa, M.; Uchida, T.; Kunikiyo, T.; Sonoda, K.; Igarashi, M.; I 📂 Article 📅 2004 🏛 IEEE ⚖ 176 KB

[IEEE Digest of Technical Papers. 2004 S

[IEEE Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Honolulu, HI, USA (2004.06.17-2004.06.17)] Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Ultra-high speed Direct Tunneling Memory (DTM) for embedded RAM applications

✍ Tsunoda, K.; Sato, A.; Tashiro, H.; Ohira, K.; Nakanishi, T.; Tanaka, H.; Arimot 📂 Article 📅 2004 🏛 IEEE ⚖ 165 KB

[IEEE Digest of Technical Papers. 2004 S

[IEEE Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Honolulu, HI, USA (2004.06.17-2004.06.17)] Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Dual work function metal gate CMOS using CVD metal electrodes

✍ Narayanan, V.; Callegari, A.; McFeely, F.R.; Nakamura, K.; Jamison, P.; Zafar, S 📂 Article 📅 2004 🏛 IEEE ⚖ 190 KB

[IEEE Digest of Technical Papers. 2004 S

[IEEE Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Honolulu, HI, USA (2004.06.17-2004.06.17)] Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Laminated metal gate electrode with tunable work function for advanced CMOS

✍ Bae, S.H.; Bai, W.P.; Wen, H.C.; Mathew, S.; Bera, L.K.; Balasubramanian, N.; Ya 📂 Article 📅 2004 🏛 IEEE ⚖ 183 KB