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[IEEE Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Honolulu, HI, USA (2004.06.17-2004.06.17)] Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Direct measurement of stress dependent inversion layer mobility using a novel test structure

✍ Scribed by Okagaki, T.; Tanizawa, M.; Uchida, T.; Kunikiyo, T.; Sonoda, K.; Igarashi, M.; Ishikawa, K.; Takeda, T.; Lee, P.; Yokomizo, G.

Book ID: 118155294
Publisher: IEEE
Year: 2004
Weight: 176 KB
Volume: 0
Category: Article
ISBN-13: 9780780382893
DOI: 10.1109/vlsit.2004.1345428

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