𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Oxygen induced broadening effects studied by RBS and SIMS

✍ Scribed by W. Vandervorst; F.R. Shepherd; M.L. Swanson; H.H. Plattner; O.M. Westcott; I.V. Mitchell

Book ID
113277685
Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
471 KB
Volume
15
Category
Article
ISSN
0168-583X

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Study on interfacial reaction of Ti/AlN
Study on interfacial reaction of Ti/AlN by SIMS, RBS and XRD
✍ Yue, Ruifeng; Wang, Yan; Wang, Youxiang; Chen, Chunhua πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 130 KB

A 200 nm Ti Ðlm was deposited on a polished AlN ceramic substrate at 200 Γ„C by electron beam evaporation and then annealed under high vacuum conditions. The MCs'-SIMS technique (detecting MCs' secondary ions under Cs' primary ion bombardment, where M is the element to be analysed), RBS and x-ray di