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Oxygen depth profiling in Kr+-implanted polycrystalline alpha titanium by means of 16O(α,α)16O resonance scattering

✍ Scribed by S. Nsengiyumva; J.P. Rivière; A.T. Raji; C.M. Comrie; D.T. Britton; M. Härting

No coin nor oath required. For personal study only.

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