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Quantitative analysis of the oxygen content in TiO2 films deposited by electron-beam evaporation using 16O(α,α)16O resonant elastic scattering

✍ Scribed by J.C. Jiang; H.S. Cheng; B. Li; Z.H. Wang; Z.Q. Zhang; F.S. Zhang; F.J. Yang


Book ID
114165586
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
143 KB
Volume
190
Category
Article
ISSN
0168-583X

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