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Oxygen agglomeration and formation of oxygen-related thermal donors in heat-treated silicon

✍ Scribed by V. V. Emtsev Jr.; C. A. J. Ammerlaan; V. V. Emtsev; G. A. Oganesyan; A. Misiuk; B. Surma; A. Bukowski; C. A. Londos; M. S. Potsidi


Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
114 KB
Volume
38
Category
Article
ISSN
0232-1300

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✦ Synopsis


Abstract

The characteristic features of production processes of thermal donors in Czochralski grown silicon heat treated at T=450Β°C under hydrostatic pressures of about 1 GPa are studied. Two families of oxygen‐related donors are formed under compressive stress. The first one is the well‐known thermal double donors whose production rate is increased by a factor of five as compared with that observed at atmospheric pressure. Along with them, new thermal donors with similar energy states are also produced. This family was found to be a dominant contributor to the thermal donors formed under compressive stress. The features of formation processes of both kinds of thermal donors are briefly discussed.


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Annihilation Studies of Oxygen-Related N
✍ D. Karg; A. Voigt; G. Pensl; M. Schulz; H.P. Strunk; W. Zulehner πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 199 KB

The annihilation kinetics of new oxygen donors (NDs) has been studied. The ND and interstitial oxygen concentration as well as the energy distribution of ND states are determined subsequent to annealing steps with various duration (2 s to 250 h) and at temperatures ranging from 875 to 1025 C. The an