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Origin and repartition of the oxide fixed charges generated by electrical stress in memory tunnel oxide

✍ Scribed by Bernardini, Sandrine; Masson, Pascal; Houssa, Michel; Lalande, Frederic


Book ID
126833190
Publisher
American Institute of Physics
Year
2004
Tongue
English
Weight
293 KB
Volume
84
Category
Article
ISSN
0003-6951

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