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The charging and discharging of high-voltage stress-generated traps in thin silicon oxide

✍ Scribed by Scott, R.S.; Dumin, D.J.

Book ID: 114536357
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 842 KB
Volume: 43
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.477603

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