✦ LIBER ✦
Mechanisms for generation of oxide trapped charges in ultrathin silicon dioxide films during electrical stress
✍ Scribed by Piyas Samanta
- Book ID
- 108271611
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 182 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0038-1101
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