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Comparison of the charges generated by Fowler-Nordheim tunneling injection in different oxides of metal-oxide-semiconductor capacitors

โœ Scribed by G. Yard; A. Meinertzhagen; C. Petit; M. Jourdain; F. Mondon


Book ID
117148386
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
389 KB
Volume
216
Category
Article
ISSN
0022-3093

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