✦ LIBER ✦
Interface State Generation in p-Type Si Metal/ Oxide/ Semiconductor Capacitors due to Fowler-Nordheim Tunneling Current Stress
✍ Scribed by Inoue, Masao; Shirafuji, Junji
- Book ID
- 125531085
- Publisher
- Institute of Pure and Applied Physics
- Year
- 1995
- Tongue
- English
- Weight
- 517 KB
- Volume
- 34
- Category
- Article
- ISSN
- 0021-4922
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