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Optical investigation of stacking faults in 4H–SiC epitaxial layers: Comparison of 3C and 8H polytypes

✍ Scribed by S. Juillaguet; T. Robert; J. Camassel

Book ID: 108215611
Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 188 KB
Volume: 165
Category: Article
ISSN: 0921-5107
DOI: 10.1016/j.mseb.2008.11.004

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