Optical capacitance-voltage characterization of charge traps in the trapping nitride layer of charge trapped flash memory devices

✍ Scribed by Lee, Jang Uk.; Roh, Kang Seob; Kang, Gu Cheol; Seo, Seung Hwan; Kim, Kwan Young; Lee, Sunyeong; Song, Kwan Jae; Choi, Chang Min; Park, So Ra; Park, Jun Hyun; Jeon, Ki Chan; Kim, Dae Hwan; Park, Byung-Gook; Lee, Jong Duk; Kim, Dong Myong

• Book ID: 124083354
• Publisher: American Institute of Physics
• Year: 2007
• Tongue: English
• Weight: 559 KB
• Volume: 91
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.2819092