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Charge trapping properties of the HfO[sub 2] layer with various thicknesses for charge trap flash memory applications

โœ Scribed by You, Hee-Wook; Cho, Won-Ju


Book ID
120308937
Publisher
American Institute of Physics
Year
2010
Tongue
English
Weight
645 KB
Volume
96
Category
Article
ISSN
0003-6951

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