✦ LIBER ✦
Reliable impurity trap memory with high charge trap efficiency using ultrathin SiO2 impurity host layer for nonvolatile memory application
✍ Scribed by Seungjae Jung; Man Chang; Seonghyun Kim; Joonmyung Lee; Chunhum Cho; Choongman Lee; Hyunsang Hwang
- Book ID
- 104052309
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 474 KB
- Volume
- 86
- Category
- Article
- ISSN
- 0167-9317
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