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Traps spectroscopy of the Si[sub 3]Ni[sub 4] layer using localized charge-trapping nonvolatile memory device

✍ Scribed by Lusky, Eli; Shacham-Diamand, Yosi; Shappir, Assaf; Bloom, Ilan; Eitan, Boaz

Book ID: 121823910
Publisher: American Institute of Physics
Year: 2004
Tongue: English
Weight: 246 KB
Volume: 85
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1774272

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