✦ LIBER ✦

[IEEE 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2012.06.10-2012.06.11)] 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Charge-trap flash memory devices fabricated with nano-scale patterns on the Si3N4 trapping layer

✍ Scribed by An, Ho-Myoung; Kim, Kyong Heon; Kim, Hee-Dong; Cho, Won-Ju; Kim, Tae Geun

No coin nor oath required. For personal study only.

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