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[IEEE 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2012.06.10-2012.06.11)] 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Mechanisms of ambient dependent mobility degradation in the graphene MOSFETs on SiO2 substrate

✍ Scribed by Lee, Y.G.; Kang, C.G.; Cho, C.; Kim, Y.H.; Hwang, H.J.; Kim, J.J.; Jung, U.J.; Park, E.J.; Kim, M.W.; Lee, B.H.

Book ID: 121747938
Publisher: IEEE
Year: 2012
Weight: 395 KB
Category: Article
ISBN: 1467309958
DOI: 10.1109/SNW.2012.6243362

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