✦ LIBER ✦

[IEEE 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2012.06.10-2012.06.11)] 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Reduced drain current variability in fully depleted silicon-on-thin-BOX (SOTB) MOSFETs

✍ Scribed by Mizutani, T.; Yamamoto, Y.; Makiyama, H.; Tsunomura, T.; Iwamatsu, T.; Oda, H.; Sugii, N.; Hiramoto, T.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2012 IEEE Silicon Nanoelectronics

✍ Sako, Ryutaro; Hasegawa, Naomi; Tsuchiya, Hideaki; Ogawa, Matsuto 📂 Article 📅 2012 🏛 IEEE ⚖ 391 KB

[IEEE 2012 IEEE Silicon Nanoelectronics

✍ Liao, Albert D.; Ong, Zhun-Yong; Serov, Andrey Y.; Xiong, Feng; Pop, Eric 📂 Article 📅 2012 🏛 IEEE ⚖ 480 KB

[IEEE 2012 IEEE Silicon Nanoelectronics

✍ Balandin, A.A.; Rumyantsev, S.; Liu, G.; Shur, M.S.; Potyrailo, R.A. 📂 Article 📅 2012 🏛 IEEE ⚖ 285 KB

[IEEE 2012 IEEE Silicon Nanoelectronics

✍ Shahil, K. M. F.; Goyal, V.; Gulotty, R.; Balandin, A. A. 📂 Article 📅 2012 🏛 IEEE ⚖ 528 KB

[IEEE 2012 IEEE Silicon Nanoelectronics

✍ Lemme, M.C.; Vaziri, S.; Smith, A.D.; Li, J.; Rodriguez, S.; Rusu, A.; Ostling, 📂 Article 📅 2012 🏛 IEEE ⚖ 873 KB

[IEEE 2012 IEEE Silicon Nanoelectronics

✍ Wu, Yi; Yu, Shimeng; Guan, Ximeng; Wong, H.-S. Philip 📂 Article 📅 2012 🏛 IEEE ⚖ 943 KB