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[IEEE 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2012.06.10-2012.06.11)] 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Investigation into the effect of the variation of gate dimensions on program characteristics in 3D NAND flash array

✍ Scribed by Seo, Joo Yun; Kim, Yoon; Park, Se Hwan; Kim, Wandong; Kim, Do-Bin; Lee, Jong-Ho; Shin, Hyungcheol; Park, Byung-Gook

Book ID: 121528501
Publisher: IEEE
Year: 2012
Weight: 378 KB
Category: Article
ISBN: 1467309958
DOI: 10.1109/SNW.2012.6243320

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