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On the effect of hot-carrier stressing on MOSFET terminal capacitances

โœ Scribed by Yao, C.T.; Peckerar, M.; Friedman, D.; Hughes, H.


Book ID
114535424
Publisher
IEEE
Year
1988
Tongue
English
Weight
339 KB
Volume
35
Category
Article
ISSN
0018-9383

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