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Effects of hot carrier stress on the RF performance in SOI MOSFETs

Book ID: 108210495
Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 703 KB
Volume: 44
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2004.07.083

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applications in the terahertz spectra. Future works will address realization and characterization of such a system and the microfluidic management operation.