✦ LIBER ✦
On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs
- Book ID
- 108210496
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 499 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0026-2714
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