✦ LIBER ✦

The effect of channel hot-carrier stressing on gate-oxide integrity in MOSFETs

✍ Scribed by Chen Ih-Chin; Choi Jeong Yeol; Hu Chenming

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Channel hot-carrier stressing of reoxidi

✍ Dunn, G.J.; Krick, J.T. 📂 Article 📅 1991 🏛 IEEE 🌐 English ⚖ 649 KB

Analysis of gate oxide thickness hot car

✍ Doyle, B.S.; Mistry, K.R.; Cheng-Liang Huang 📂 Article 📅 1995 🏛 IEEE 🌐 English ⚖ 658 KB

DC pulse hot-carrier-stress effects on g

✍ Ja-Hao Chen; Shyh-Chyi Wong; Yeong-Her Wang 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 173 KB

Characterization of hot carrier degradat

✍ R. Mahnkopf; G. Przyrembel; H. G. Wagemann 📂 Article 📅 1991 🏛 Springer 🌐 English ⚖ 811 KB

Characterization of hot carrier degradat

✍ Beitrag R. Mahnkopf; G. Przyrembel; H. G. Wagemann 📂 Article 📅 1991 🏛 Springer 🌐 English ⚖ 16 KB

On the effect of hot-carrier stressing o

✍ Yao, C.T.; Peckerar, M.; Friedman, D.; Hughes, H. 📂 Article 📅 1988 🏛 IEEE 🌐 English ⚖ 339 KB