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Effects of measurement frequency and temperature anneal on differential gate capacitance spectra observed in hot carrier stressed MOSFET's

✍ Scribed by Liang, C.H.; Ang, D.S.; Tan, S.E.

Book ID: 114536144
Publisher: IEEE
Year: 1995
Tongue: English
Weight: 804 KB
Volume: 42
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.398669

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