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On the dynamic NBTI of the HfO2 and HfSiON P–MOSFET

✍ Scribed by Y. Gao; D.S. Ang; A.A. Boo; Z.Q. Teo

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

On the effects of NBTI degradation in p-

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Development of an Ultrafast On-the-Fly T

✍ Maheta, V.D.; Kumar, E.N.; Purawat, S.; Olsen, C.; Ahmed, K.; Mahapatra, S. 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 751 KB

Impact of the TiN electrode deposition o

✍ C. Gaumer; E. Martinez; S. Lhostis; M.-J. Guittet; M. Gros-Jean; J.-P. Barnes; C 📂 Article 📅 2011 🏛 Elsevier Science 🌐 English ⚖ 495 KB

Modelling of the dynamic threshold MOSFE

✍ Jimenez-P, A.; De la Hidalga-W, F.J.; Deen, M.J. 📂 Article 📅 2005 🏛 The Institution of Electrical Engineers 🌐 English ⚖ 205 KB

On the generation and recovery of interf

✍ Mahapatra, S.; Saha, D.; Varghese, D.; Kumar, P.B. 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 335 KB

On the Defect Structure of ZrO[sub 2] an

✍ Kofstad, P.; Ruzicka, D. J. 📂 Article 📅 1963 🏛 The Electrochemical Society 🌐 English ⚖ 429 KB