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Development of an Ultrafast On-the-Fly Technique to Study NBTI in Plasma and Thermal Oxynitride p-MOSFETs

✍ Scribed by Maheta, V.D.; Kumar, E.N.; Purawat, S.; Olsen, C.; Ahmed, K.; Mahapatra, S.

Book ID: 114619160
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 751 KB
Volume: 55
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2008.2003224

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