On the generation and recovery of interface traps in MOSFETs subjected to NBTI, FN, and HCI stress

✍ Scribed by Mahapatra, S.; Saha, D.; Varghese, D.; Kumar, P.B.

• Book ID: 114618313
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 335 KB
• Volume: 53
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2006.876041