Isolation of NBTI Stress Generated Interface Trap and Hole-Trapping Components in PNO p-MOSFETs

✍ Scribed by Mahapatra, S.; Maheta, V.D.; Islam, A.E.; Alam, M.A.

• Book ID: 114619290
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 248 KB
• Volume: 56
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.2010569