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On the effects of NBTI degradation in p-MOSFET devices

โœ Scribed by H. Hussin; N. Soin; N.M. Karim; S.F. Wan Muhamad Hatta


Book ID
116833957
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
228 KB
Volume
407
Category
Article
ISSN
0921-4526

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